A new XRF spectrometer in response to the stringent regulations of RoHS2022/05/31 > Back
XRF is a non-destructive analytical technique that measures the fluorescent (or secondary) x-ray emitted from a sample when it is excited by a primary x-ray source. The strength of the signal can be used to determine the thickness of the coating; a second reading can determine the thickness of the substrate.
1. It can measure up 5 coating layers simultaneously, all of which can be alloys. The coating thickness can be measured from 0.01 to approximately 50.00 micrometer, depending on the material.
2. The detection limit of hazardous substances restricted in RoHS directive can reach 2ppm. Measurable elements: Sulfur (S) to Uranium (U); Analysis range: 1ppm to 99.99%